http://www.loc.gov/mods/v3 http://www.loc.gov/standards/mods/v3/mods-3-2.xsd
Materials characterization using nondestructive evaluation (NDE) methods
1. Atomic force microscopy (AFM) for materials characterization / M.K. Khan, Q.Y. Wang, M.E. Fitzpatrick. 2. Scanning electron microscopy (SEM) and transmission electron microscopy (TEM) for materials characterization / B.J. Inkson. 3. X-ray microtomography for materials characterization / R. Hanke, T. Fuchs, M. Salamon, S. Zabler. 4. X-ray diffraction (XRD) techniques for materials characterization / J. Epp. 5. Microwave, millimeter wave and terahertz (MMT) techniques for materials characterization / C. Sklarczyk. 6. Acoustic microscopy for materials characterization / R.Gr. Maev. 7. Ultrasonic techniques for materials characterization -- G. Hübschen. 8. Electromagnetic techniques for materials characterization / I. Altpeter, R. Tschuncky, K. Szielasko. 9. Hybrid methods for materials characterization / R. Tschuncky, K. Szielasko, I. Altpeter.
Includes bibliographical references and index.
Woodhead Publishing series in electronic and optical materials ; no. 88