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Proceedings.
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X rays in theory and experiment.
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Diffuse X-ray reflections from crystals.
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Crystallography and crystal perfection;
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Date for X-ray analysis.
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Date for X-ray analysis.
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Date for X-ray analysis.
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Quantitative Xray diffractometry.
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Optique des rayons X et microanalyse, X-ray optics and microanalysis, IVe Congrès international sur l'optique des rayons X et la microanalyse, Orsay, [7-10] septembre 1965.
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The powder method in X-ray crystallography.
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Methods and practices in X-ray powder diffraction.
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Elements of X-ray diffraction.
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Elements of X-ray diffraction.
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X ray diffraction in crystals, imperfect crystals, and amorphous bodies.
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X-ray diffraction procedures for polycristalline and amorphous materials.
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An introduction to x-ray crystallography.
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X-ray identification and crystal structures of clay minerals.
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Small-angle scattering of x-rays.
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Elements of Xray diffraction.
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The theory of crystal structure analysis.
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X-ray diffraction procedures for polycristalline and amorphous materials.
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The interpretation of X-ray diffraction photographs.
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Selected topics in X-ray crystallography: from the Delft X-ray institutes.
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X-ray determination of electron distributions,
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Difracción de rayos X; aplicaciones analíticas en la investigación científica e industrial.
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Topic: RAYOS X
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Electron probe quantitation
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X rays in theory and experiment.
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Horia Hulubei:: Selected papers
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Microprobe analysis.
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Electron microprobe analysis.
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Physical fundamentals of materials science
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Proceedings.
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Fundamentos de la física moderna
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The interpretation of X-ray diffraction photographs.
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X-rays and their applications
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Selected topics in X-ray crystallography: from the Delft X-ray institutes.
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Date for X-ray analysis.
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Date for X-ray analysis.
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Date for X-ray analysis.
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Mathematical theory of X-ray powder diffractometry.
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X-ray determination of electron distributions,
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Crystallography and crystal perfection;
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General cytochemical methods.
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Optique des rayons X et microanalyse, X-ray optics and microanalysis, IVe Congrès international sur l'optique des rayons X et la microanalyse, Orsay, [7-10] septembre 1965.
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Quantitative electron-probe microanalysis
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Principles of modern physics.
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Author: Möllenstedt, G.
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Author: International congress on x-ray optics and microanalysis
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Proceedings.
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Author: Gaukler, K.H
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Author: International congress on x-ray optics and microanalysis
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Proceedings.
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