Modeling of the tunneling current in MOS devices after proton irradiation using a nonlinear series resistance correction by Palumbo, Félix Roberto Mario, Miranda, Enrique

Get full text

Influence of the spatial distribution of border traps in the capacitance frequency dispersion of Al2O3/InGaAs by Palumbo, Félix Roberto Mario, Aguirre, Fernando Leonel, Pazos, Sebastián Matías, Krylov, Igor, Winter, Roy, Eizenberg, Moshe

Get full text

A Dual Core Low Power Microcontroller with openMSP430 Architecture for High Reliability Lockstep Applications Using a 180 nm High Voltage Technology Node by Sondon, Santiago Martin, Mandolesi, Pablo Sergio, Masson, Favio Roman, Julian, Pedro Marcelo, Palumbo, Félix Roberto Mario

Get full text

Evolution of the gate current in 32 nm MOSFETs under irradiation by Palumbo, Félix Roberto Mario, Debray, Mario Ernesto, Vega, Nahuel Agustín, Quinteros, Cynthia Paula, Kalstein, Ariel, Guarin, F.

Get full text

The Atomic Layer Deposition Technique for the Fabrication of Memristive Devices: Impact of the Precursor on Pre-deposited Stack Materials by Quinteros, Cynthia Paula, Hardtdegen, Alex, Barella, Mariano, Golmar, Federico, Palumbo, Félix Roberto Mario, Curiale, Carlos Javier, Hoffmann Eifert, Susanne, Levy, Pablo Eduardo

Get full text

Continuous high-altitude measurements of cosmic ray neutrons and SEU/MCU at various locations: correlation and analyses based-on MUSCA SEP³ by Hubert, G., Velazco, R., Federico, C., Cheminet, A., Silva Cardenas, C., Caldas, L. V. E., Pancher, F., Lacoste, V., Palumbo, Félix Roberto Mario, Mansour, W., Artola, L., Pineda, F., Duzellier, S.

Get full text

Óxidos delgados para micro y nanoelectrónica: Degradación, ruptura y aplicaciones tecnológicas by Quinteros, Cynthia Paula

Other Authors: “…Palumbo, Félix…”
Get full text