Microbeam and nanobeam analysis.

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Bibliographic Details
Main Author:	Benoit, Daniele (ed.)
Corporate Author:	Workshop on modern developments and applications in microbeam analysis
Other Authors:	Bresse, Jean Francois (ed.), Van't dack, Luc (ed.), Werner, Helmut (ed.), Wernisch, Johann (ed.)
Format:	Conference Proceeding Book
Language:	English
Published:	Wien, New York : Springer, 1996.
Subjects:	MICROSCOPIA ELECTRONICA -CONGRESOS METALES -MICROANALISIS -CONGRESOS
Online Access:	View in OPAC
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Holdings details from Centro de Información Eduardo Savino
Call Number:	537.533.35 B44 1995
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