ADVANCES in X-ray analysis.

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Bibliographic Details
Corporate Authors:	Conference on Applications of X-Ray Analysis Denver, Colo,US, Conference on Industrial Applications of X-Ray Analysis
Other Authors:	Mueller, William Martin, ed
Format:	Conference Proceeding Book
Language:	English
Published:	New York: London: Plenum pressI. Pitman and sons, ltd., 1960
Subjects:	RADIACION X DIFRACCION FLUOROSCOPIA MICROANALISIS SONDAS ELECTRONICAS
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3rd Floor Main Library

Holdings details from 3rd Floor Main Library
Call Number:	A1234.567
Copy 1	Available